Cella di prova integrata per lo screening KGD
Sintesi redazionale: Teradyne ha annunciato una cella di test integrata che supporta lo screening dei dispositivi di comprovata funzionalità (KGD) per dispositivi utilizzati in applicazioni di intelligenza artificiale e nei data center, sviluppata in collaborazione con Tokyo Electron (TEL). Il.... Fonte originale: https://www.electronicsweekly.com/news/business/integrated-test-cell-for-kgd-screening-2026-06/
<p>The system pairs Teradyne’s UltraFLEXplus platform with TEL’s Prexa SDP (Singulated Device Prober) to provide fabless designers, foundries, and OSATs a production-ready path to high-quality device screening at multiple points in the advanced packaging flow.</p><p>As AI and data center device architectures increasingly adopt chiplet-based designs that integrate multiple die into a single 2.5D or 3D package, a single defective die can compromise the entire high-value package. Adding KGD screening is essential to protecting final yield, improving quality, and maximizing output.</p><p>The system delivers a validated test cell designed to reduce integration risk for high-volume manufacturing. Within the test cell, Teradyne’s UltraFLEXplus instruments coordinate with TEL’s Prexa SDP, which maintains device temperature and manages the high-power dissipation characteristics typical of leading-edge AI silicon.</p><p>Built on an open ecosystem architecture, the product provides customers with flexibility across complementary probe cards, manipulators, and interface technologies, and can be integrated with other probers or testers as required.</p><p>By combining Teradyne’s UltraFLEXplus platform with TEL’s Prexa SDP prober, customers gain access to a robust, production-ready KGD screening solution that helps ensure advanced 2.5D and 3D packages achieve the reliability and performance required AI and datacentre architectures.</p>